Keysight E4362A/J06 Solar Array Simulator Module: Power Your Solar Testing with Precision
Keysight E4362A/J06 Solar Array Simulator Module: 180 V, 3.4 A, 565 W J06 Option E4360 Series
Description
Keysight E4362A/J06 Solar Array Simulator Module with J06 Option Product Description: The Keysight E4362A/J06 Solar Array Simulator Module is a high-performance, programmable DC power source designed to simulate the electrical characteristics of a solar array. With its advanced features and capabilities, it provides a versatile and reliable solution for testing and evaluating photovoltaic (PV) systems and components. Product Specifications: Voltage Range: 0 to 180 V Current Range: 0 to 3.4 A Power Output: 565 W Number of Channels: 1 Output Impedance: 0.1 Ω Ripple and Noise: <1 mVpp Features and Benefits: High Accuracy and Stability: Delivers precise and stable voltage and current outputs, ensuring accurate simulation of solar array behavior. Programmable Output: Allows users to create custom waveforms and sequences to simulate various solar conditions. J06 Option: Includes a built-in irradiance sensor for real-time measurement of solar irradiance. Intuitive User Interface: Features a user-friendly front panel and software interface for easy setup and operation. Versatile Connectivity: Supports multiple communication interfaces, including USB, LAN, and GPIB, for seamless integration with other test equipment. Value to the Customer: The Keysight E4362A/J06 Solar Array Simulator Module offers exceptional value to customers by: Accelerating PV System Development: Enables efficient testing and validation of PV systems, reducing development time and costs. Improving PV Component Performance: Provides accurate simulation of solar conditions, allowing manufacturers to optimize the performance of PV modules and inverters. Ensuring System Reliability: Helps identify potential issues and ensure the reliability of PV systems before deployment. * Simplifying Test Setup: Integrates multiple functions into a single module, reducing the complexity and cost of test setups.
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